INSTRUMENTATION

Gemini SEM 500 (Zeiss)

The Gemini SEM 500 is a high resolution SEM. It works both at high vacum mode and several low vacuum levels. It is equipped with the following detectors; the E-T detector collects SE2 electrons and provide topographical information, the new high efiiciency in-lens detector collects SE1 electrons and provide high resolution surface information, the EsB detector (which is an in lens detector) collects BS electrons at low voltages thus provide composition contrast for all samples including nonconductive or beam sensitive samples, the multi diodes STEM detector collects transmitted electrons of thin samples at several modes (BF, DF, HAADF), The AsB detectors (one for high vacuum one for low vacuum) collect BS detectors for material and orientationl information, the LVSE detector collects SE information in all low vacuum modes. This SEM is also equipeed with EDX detector (60mm from Bruker) and CL detector and spectrometer (CL Elite from Gatan). Furthermore, the Gemini SEM 500 is equipped with a cryo stage for cryo imaging of biological samples and synthetic soft materials.

Characteristics & Accessories

  1. Accelerating voltage: 0.02 to 30 kV
  2. High efficiency in-lens SE detector
  3. EsB detector with filtering grid for the detection of energy selective backscattered electrons.
  4. STEM detector (BF, DF, HAADF)
  5. AsB detectors (for both high and low vacuum modes)
  6. Cryo-stage - Leica 
  7. EDS Bruker XFlash/60mm 
  8. CL detector and sepctrometer (MonoCL4 Elite from Gatan)

 

Contact: Dr. Ifat Kaplan-Ashiri 


Room 005

Ultra 55 FEG (Zeiss)

The Zeiss Ultra 55 is a high resolution SEM. It is equipped with several detectors; the E-T detector collects SE2 electrons and provide topographical information, the in-lens detector collects SE1 electrons and provide high resolution surface information, the EsB detector (which is an in lens detector) collects BS electrons at low voltages thus provide composition contrast for all samples including nonconductive or beam sensitive samples, the STEM detector collects transmitted electrons of thin samples (up to 100nm) at 30kV. Furthermore, the Ultra 55 is equipped with a cryo stage for cryo imaging of biological samples and synthetic soft materials.

Characteristics & Accessories

  1. Accelerating voltage: 0.1 to 30 kV
  2. High resolution imaging:  1 nm resolution at 15kV
  3. High efficiency in-lens SE detector
  4. STEM detector
  5. Cryo-stage - Leica (formerly BAl-Tec)
  6. EsB detector with filtering grid for the detection of energy selective backscattered electrons
  7. EDS Bruker XFlash/60mm

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Elena Kartvelishvily

Supra 55 FEG (Zeiss, formerly LEO)

The Zeiss Supra 55 is a high resolution SEM. It is equipped with several detectors; the E-T detector collects SE2 electrons and provide topographical information, the in-lens detector collects SE1 electrons and provide high resolution surface information, the AsB detector collects BS electrons at voltages higher than 5kV and provide composition and channeling contrast, the CL detector collects photons that can be emitted as a result of electron-hole recombination in semiconductor samples, the EDS collects x-ray signals and provide elemental analysis. Mechanical characterization of materials can be done in-situ the Supra 55 using the Kleindiek nano manipulation and force measurement system.

Characteristics & Accessories

  1. Accelerating voltage: 0.1 to 30 kV
  2. High resolution imaging: 1 nm resolution at 15 kV
  3. High efficiency in-lens SE detector
  4. AsB – angle selective backscattered detector
  5. CL – cathodoluminescence detector
  6. EDS Bruker XFlash/60mm 
  7. Variable pressure operation till 1 torr
  8. Nano manipulation system for a nm precision movement (Kelindiek)
  9. Force measurement system for measurements at the nano Newton to micro Newton scale (Kelindiek)

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Anna Kossoy

Sigma 500 SEM (Zeiss)

The Zeiss Sigma 500 is a high resolution SEM. It is equipped with several detectors; the new generation E-T detector can filter out SE3 electrons, thus it collects mainly SE2 electrons and provide topographical information, the in-lens Duo detector collects SE1 and BS electrons and provide high resolution surface information together with material information, the HD-AsB provides material and orientational information.

Characteristics & Accessories

  1. Accelerating voltage: 0.3 to 30 kV
  2. In-Lens Duo detector with filtering grid for the detection of energy selective backscattered electrons
  3. HD-AsB detector

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Elena Kartvelishvily

Quattro S – environmental SEM (Thermo Fisher Scientific)

Wet, oily, dirty, outgassing and non-conductive samples can be examined in their natural state without significant sample modification or preparation. A series of pressure-limiting apertures integrated in the pole piece creates different levels of vacuum in the specimen chamber and in the column. High pressure, thus created in the chamber, combined with gaseous secondary electron detectors, permits the observation of non-conductive and wet specimens. The microscope also works in the conventional high vacuum mode, providing high resolution images of conductive specimens.

Characteristics & Accessories

  1. Accelerating voltage: 0.02 to 30 kV
  2. Environmental modes for pressures as high as 4000Pa (H2O or N2)
  3. SE detectors for all vacuum modes (SE-ET, LVD, GSED)
  4. BS detectors for all vacuum modes (lens mounted DBS and ESEM GAD)
  5. Retractable STEM 3+ Detector
  6. Retractable Wet STEM Detector
  7. Cooling Stage (for wet mode)
  8. 1400 degC Heating Stage
  9. EDS for elemental analysis (Bruker)
  10. In-Chamber Nav-Cam

Contact: Dr. Anna Kossoy and Dr. Ifat Kaplan-Ashiri 

Helios 600 FIB/SEM Dual Beam Microscope (Thermo Fisher Scientific)

Dual beam FIB-SEM is a multifunctional analytical instrument integrating both a focused ion beam (FIB) and a scanning electron microscope (SEM) in a single system. This tool offers a number of key techniques and applications: FIB site specific cross sectioning and SEM inspection on a wide variety of samples (electronics, ceramics, metallurgic, biology…), TEM sample preparation, as well as STEM sub-nanoscale imaging, nano-machining and patterning, deposition of Pt, W and C both ion- or electron- assisted and 3D visualization of volumes. Actually, due to its high performance and accessories many other applications arise continuously, so do not hesitate to contact for your specific needs or application.

Characteristics & Accessories

  1. E-beam Schottky FEG, I-beam Ga LMIS
  2. Accelerating Voltage: E-beam 0.35 to 30 kV, I-beam 0.5-30 kV
  3. High resolution imaging: 1 nm resolution at 15 kV, 2.5 nm at 1 kV, WD 4 mm
  4. High resolution ion beam: 5 nm at 30 kV
  5. Probe current: E-beam <22 nA, I-beam 1.5 pA-21 nA
  6. High efficiency in-lens SE/BSE detector
  7. E-T SE/BSE chamber detector
  8. CDEM for SI and SE detection
  9. STEM detector
  10. Beam-assisted material deposition of Pt, W, C
  11. Omniprobe and Kleindiek micromanipulators
  12. Four point probe microscopic measurements
  13. Cryo-stage (BAl-Tec AG, Liechtenstein)
  14. EDS elemental analysis

 

Contact: Katya Rechav

Crossbeam 550 FIB/SEM dual beam microscope (Zeiss)

Crossbeam 550 (Zeiss) is a dual-beam Focused ion beam - Scanning electron (FIB-SEM) instrument.

  • 3D imaging of biological samples of cells and tissues at isotropic resolutions down to 5 nm at room temperature and at cryo conditions
  • Cryo lamellae preparation for cryo STEM analysis.
  • Enhanced resolution at low voltages and an outstanding stability for long-term 3D tomography.
  • TSEM mode ability.

Characteristics & Accessories:

FIB column:

Ga+ LMIS; Accelerating voltage range 500v – 30kV; Probe current 1pA-100nA; High resolution (<3nm @30kV). Excellent spot profiles, long-term current stability.

Gemini-II SEM column:

  1. Schottky FEG DENKA; High resolution (1.6 nm @1kV)
  2. Simultaneously operating mode FIB + high resolution SEM
  3. E-T SE, Inlens SE and Energy Selective BSE detectors
  4. TSEM detector
  5. Multi-channel Gas Injection System C, Pt, water
  6. Cryo-stage (Leica)
  7. EDS Bruker (crystal 60mm)

Contact: Katya Rechav

Titan Krios G3i (Thermo Fisher Scientific)

Titan Krios G3i S/TEM microscope from Thermo Fisher Scientific (TFS) is used for advanced, high-throughput, high-resolution 3D imaging and structural elucidation of proteins, cells and other biological specimens by cryo-TEM single particle analysis, and cryo-(S)TEM tomography. It features an AutoLoader that holds up to 12 cryo-preserved specimens, two direct electron detectors (TFS Falcon III and Gatan K3), energy filtering and software for automated imaging. There are three annular dark field and one bright field STEM detector. One of the DF detectors features four quadrants for phase STEM imaging (iDPC method).

Characteristics & Accessories

  1. Accelerating voltage: 80-300 kV
  2. X-FEG Electron source
  3. AutoLoader
  4. Falcon 3EC direct detector (above energy filter)
  5. Gatan K3 direct detector mounted at the end of Gatan BioQuantum energy filter
  6. Ceta 16M Camera
  7. Dual-axis tomography compustage
  8. STEM detectors: BF, DF, HAADF, iDPC
  9. Volta Phase Plate
  10. Software: EPU, Tomography, Velox, TIA, GMS3, SerialEM, AutoCTF, Gatan Latitude.
  11. Environmental enclosure
  12. Remote operation

Contact: Dr. Nadav Elad and Dr. Sharon Wolf

Themis-Z (Thermo Fisher Scientific)

The Thermo Fisher Scientific Themis Z is an ultra-high resolution, double aberration-corrected, transmission electron microscope for analytical scanning probe and wide-field microscopy delivering ultimate optical performance and flexibility. This high-end analytical (S)TEM is used to answer the most complex questions regarding materials science.

Characterisics & Accessories:

  1. spatial resolution better than 70 pm
  2. system energy resolution obtained is 70 meV
  3. high-brightness electron gun
  4. Wien-type monochromator
  5. two Rose-Haider double-hexapole aberration correctors (probe and image)
  6. Super-X large solid angle X-ray detector for EDS
  7. Quantum GIF 966 ERS high-performance energy loss spectrometer for EELS and EFTEM
  8. OneView high-speed CMOS camera for wide-field TEM imaging and in-situ data recording
  9. multiple STEM detectors for bright-field, annular dark-field, differential phase contrast
  10. four acceleration voltages in TEM and STEM
  11. low voltage operation at 40 kV
  12. Cornell pixelated STEM detector for 4D-STEM (EMPAD)

 

Contact: Dr. Lothar Houben and Dr. Olga Brontvein

Talos Arctica G3 (Thermo Fisher Scientific)

Talos Arctica G3 S/TEM microscope from Thermo Fisher Scientific (TFS) is used for advanced, high-throughput imaging, efficient screening of cryo-EM samples, 3D structural elucidation of cells and other biological specimens by cryo-STEM tomography, and electron diffraction. It features an AutoLoader that holds up to 12 cryo-preserved specimens and software for automated imaging.

Characteristics & Accessories

  1. Accelerating voltage: 80-300 kV
  2. X-FEG Electron source
  3. AutoLoader
  4. Gatan OneView camera
  5. STEM detectors: BF, DF
  6. Software: EPU, Tomography, Velox, TIA, GMS3, SerialEM.
  7. Remote operation

Contact: Dr. Nadav Elad and Dr. Sharon Wolf

Tecnai Spirit (Bio-Twin) TEM (Thermo Fisher Scientific)

The FEI Spirit TEM microscope is ideal for imaging biological cells and tissues that have been fixed, embedded and stained. The “Bio-Twin” lens configuration provides extremely high contrast, and the ability to observe at extremely low magnifications with the objective aperture inserted. Two digital cameras provide easy recording of images.

Characteristics & Accessories

  1. Accelerating voltage: 60-120 kV
  2. E-beam source, tungsten thermal emission
  3. Bottom-mount CCD camera: FEI Eagle 2k X 2k
  4. Side-mounted high-speed lens-coupled camera: Olympus MegaView III
  5. Multiple Image-stitching for wide field-of-view with high detail

 

Contact: Dr. Smadar Levin-Zaidman and Dr. Nili Desorella

Tecnai T12 (Twin) TEM (Thermo Fisher Scientific)

The FEI Tecnai T12 TEM microscope is used for imaging biological cells and tissues as well as for cryoTEM of biological macromolecules and soft materials. Cryo-blades provide contamination-free environment for observing cryo-preserved specimens. A high-sensitivity,  high-speed, low-noise bottom-mount CMOS camera provides superb quality for all applications, and especially for  low-dose imaging.

Characteristics & Accessories

  1. Accelerating voltage: 60-120 kV
  2. E-beam source, LaB6 thermal emission
  3. Bottom-mount CMOS camera: Gatan OneView
  4. Side-mounted high-speed lens-coupled camera: Gatan Erlangshen ES500W
  5. Cryo-blades and a variety of Gatan cryo-holders (Gatan 626-60, 626-70, 914)
  6. Low-dose software
  7. Tomography-grade compustage

 

Contact: Dr. Nadav Elad

Tecnai G2 F20 (Twin) TEM/STEM -Energy Filtered Direct Electron Detection

The FEI Tecnai G2 F20 S/TEM microscope is used for advanced biological EM imaging, chemical analysis, and 3D structural elucidation by TEM  and STEM tomography, including of cryo-preserved specimens. It features advanced energy filtering and direct electron detection

Characteristics & Accessories

  1. Accelerating voltage: 120-200 kV.
  2. E-beam source, Schottky field emission source.
  3. Gatan TAC100 cryo-blades and a variety of Gatan cryo-holders (Gatan 626-60, 626-70, 914).
  4. Point resolution 0.27 nm. STEM line resolution ~0.34 nm.
  5. FEI Low-Dose software.
  6. Tomography-grade compustage.
  7. CryoTEM imaging using low-dose methods of soft materials, macromolecules and cryo-preserved tissues and cells.
  8.  Gatan Quantum 967 “special” energy filter, with K2 summit direct electron detector.
  9. Chemical and elemental analysis by electron energy loss spectrometry (EELS) and energy filtered imaging (EFTEM).
  10. Energy dispersive spectrometer (EDAX) with retractable, liquid N2 cooled, Si(Li) detector.
  11. STEM and cryoSTEM tomography using a Fischione HAADF detector at the 35 mm port, and a Gatan BF/DF detector below the fluorescent screen.
  12. Tomography software: SerialEM and FEI Explore3D.
  13. STEM-EDX and STEM-PEELS analysis.

 

Contact: Dr. Eyal Shimoni and Dr. Sharon Wolf

JEM 2100 (HT) TEM (JEOL)

The JEM 2100 is dedicated to characterize various materials specimens both nanomaterials and thin lamellas prepared from bulk materials by FIB sectioning. Characterization involves lattice imaging (point resolution 0.24nm), recording of electron diffraction patterns and elemental analysis by EDS. This microscope has STEM mode that enables STEM-EDS line scans and mapping.

Characteristics & Accessories

  1. Accelerating voltage: 200 kV
  2. E-beam source, LaB6 thermal emission
  3. Bottom-mount CCD camera: Gatan UltrascanXP 2k x 2k
  4. Energy dispersive spectrometer (Thermo Fisher) with retractable, SSD detector

 

Contact: Dr. Olga Brontvein and Dr. Lothar Houben

STORM/PALM Vutara 352 Super Resolution Microscope (Bruker)

Vutara SR-352 (Bruker) super resolution microscope is based on single molecule localization techniques (PALM, STORM, etc.). It enables 3D quantitative imaging at the nanoscale, 10 times or better than that of conventional light microscopes.

It contains four microscopes in one platform:

  • 3D super resolution microscope (PALM/STORM)
  • Single molecule particle tracking (localization microscopy)
  • Opterra II confocal microscope
  • Widefield microscope

Characteristics & Accessories

  1. 20 nm (xy) resolution, 50 nm (z) resolution
  2. Biplane technology provides 3D imaging during all aqusitions
  3. Supports 5 excitation colors (405, 488, 561, 640 and 750 nm high power lasers)
  4. Images as deep as 30 microns

 

Contact: Dr. Tali Dadosh

Opterra II Confocal Microscope (Bruker)

Opterra II (Bruker) is a swept-field confocal microscope utilizes proprietary one-dimensional pinhole array technology to combine the resolution of traditional confocal systems with the speed typically associated with wide-field imaging.

Characteristics & Accessories:
a. FRAP
b. Photoconversion
c. Photoablation and uncaging to occur simultaneously with imaging.
d.
Live cell system with associated temperature controller
e. Rapid heating and cooling

 

Contact: Dr. Tali Dadosh

Cryo-CLEM Fluorescence Microscope (Linkam)

The cryo-light fluorescent microscope enables imaging at cryogenic temperature conditions for the correlation with cryo electron microscopy. It is equipped with LED light source at several wavelengths and a cryo-stage to hold the sample under cryo conditions. It is designed to provide imaging of fluorescently labelled biological specimen on EM grids and thin substrates.

Characteristics & Accessories

  1. Olympus BX51 Microscope with 20x and 40x (air) objectives
  2. LED illumination
  3. Cryo-holder design for speciments including TEM grids (Linkam)

 

Contact: Dr. Tali Dadosh

Cryo CLEM Fluorescence Microscope (Leica)

Cryo CLEM Fluorescence Microscope (Leica) is a widefield light microscope for Correlative Light and Electron Microscopy (CLEM) at cryogenic temperatures. It is equipped with LAS X Cryo CLEM software that automatically scans the sample and generates a high-resolution overview image. The CLEM Viewer allows fast and precise location of points of interest and coordinates can be transferred directly to the electron microscope acquisition software SerialEM for correlation.

Contact: Dr. Tali Dadosh

Xradia Micro-CT X-ray Tomographic Microscope (Zeiss)

The Xradia Micro-CT instrument is designed to provide high resolution X-ray tomographic images at 1 µm resolution. Complete 3D images without missing wedge of samples up to 5 cm in size can be obtained by taking a complete set of projection images while the sample rotates 180 or 360 degrees. The final resolution of the images depends on the exposure time, rotation step and inherent contrast in the sample.

Characteristics

  1. X-ray source (Hamamatsu) 20-90KV and up to 200 µA
  2. Focal spot 5 µm
  3. Double projection design (x-ray and optical projection)
  4. Magnifications 0.5x, 4x, 10x, 20x, 40x
  5. Pixel size 0.3-20 µm
  6. Field of view up to 70 mm

Accessories

  1. Filter set with attenuation between 20-70%
  2. Different sample holders
  3. Homemade holder for high humidit

 

Contact: Dr. Vlad Brumfeld

Contact: Vlad Brumfeld

RX DeskTom micro CT

The RX DeskTom micro CT instrument is designed to take medium resolution tomographic X-ray images of samples up to 20 cm in size. It completes the high-resolution Xradia instrument by offering scans with higher speed and larger field of view.

Characteristics

  1. X-ray source (open berilium window) 40-130 kV, up to 32 W power.
  2. Three adjustable ranges of focal spot size, depending on the desired resolution.
  3. Field of view up to 30 cm.
  4. Flat panel fast detector with high speed and medium resolution.

Accessories

  1. Diverse sample holders
  2. Self-centering sample tool (home made)
  3. Complex system for temperature and illumination control.

Contact: Dr. Vlad Brumfeld

Xradia Versa 520 (Zeiss)

The Xradia Versa 520 instrument is designed to provide X-ray tomographic images with 600 nm resolution. Complete 3D images without missing wedge of samples up to 14 cm in size is obtained by taking a complete set of projection images while the sample rotates 180 or 360 degrees. The final resolution of the images depends on the exposure time, sample size and total number of projections. High Voltage X-ray source (up to 160kV) allows accurate measurements of highly absorbing samples such as single crystals and metals

Characteristics

  1. X-ray source with 30-160KV and up to 10W output
  2. Focal spot 2 µm
  3. Double projection design (x-ray and optical projection)
  4. Optical magnifications of 0.4x, 4x, 20x, 40x
  5. Pixel size 0.1-45 µm
  6. Field of view up to 14 cm

Accessories

  1. Filter wheel with filters between 20-70%
  2. Different sample holders
  3. Full environmental chamber with temperature, humidity and deformation controllers
  4. Flat field detector for fast scanning large samples

Contact: Dr. Vlad Brumfeld