INSTRUMENTATION

Gemini SEM 500 (Zeiss)

The Gemini SEM 500 is a high resolution SEM. It works both at high vacum mode and several low vacuum levels. It is equipped with the following detectors; the E-T detector collects SE2 electrons and provide topographical information, the new high efiiciency in-lens detector collects SE1 electrons and provide high resolution surface information, the EsB detector (which is an in lens detector) collects BS electrons at low voltages thus provide composition contrast for all samples including nonconductive or beam sensitive samples, the multi diodes STEM detector collects transmitted electrons of thin samples at several modes (BF, DF, HAADF), The AsB detectors (one for high vacuum one for low vacuum) collect BS detectors for material and orientationl information, the LVSE detector collects SE information in all low vacuum modes. This SEM is also equipeed with EDX detector (60mm from Bruker) and CL detector and spectrometer (CL Elite from Gatan). Furthermore, the Gemini SEM 500 is equipped with a cryo stage for cryo imaging of biological samples and synthetic soft materials.

Characteristics & Accessories

  1. Accelerating voltage: 0.02 to 30 kV
  2. High efficiency in-lens SE detector
  3. EsB detector with filtering grid for the detection of energy selective backscattered electrons.
  4. STEM detector (BF, DF, HAADF)
  5. AsB detectors (for both high and low vacuum modes)
  6. Cryo-stage - Leica 
  7. EDS Bruker XFlash/60mm 
  8. CL detector and sepctrometer (MonoCL4 Elite from Gatan)

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Eyal Shimoni


Room 005

Ultra 55 FEG (Zeiss)

The Zeiss Ultra 55 is a high resolution SEM. It is equipped with several detectors; the E-T detector collects SE2 electrons and provide topographical information, the in-lens detector collects SE1 electrons and provide high resolution surface information, the EsB detector (which is an in lens detector) collects BS electrons at low voltages thus provide composition contrast for all samples including nonconductive or beam sensitive samples, the STEM detector collects transmitted electrons of thin samples (up to 100nm) at 30kV. Furthermore, the Ultra 55 is equipped with a cryo stage for cryo imaging of biological samples and synthetic soft materials.

Characteristics & Accessories

  1. Accelerating voltage: 0.1 to 30 kV
  2. High resolution imaging:  1 nm resolution at 15kV
  3. High efficiency in-lens SE detector
  4. STEM detector
  5. Cryo-stage - Leica (formerly BAl-Tec)
  6. EsB detector with filtering grid for the detection of energy selective backscattered electrons
  7. EDS Bruker XFlash/60mm

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Elena Kartvelishvily

Supra 55 FEG (Zeiss, formerly LEO)

The Zeiss Supra 55 is a high resolution SEM. It is equipped with several detectors; the E-T detector collects SE2 electrons and provide topographical information, the in-lens detector collects SE1 electrons and provide high resolution surface information, the AsB detector collects BS electrons at voltages higher than 5kV and provide composition and channeling contrast, the CL detector collects photons that can be emitted as a result of electron-hole recombination in semiconductor samples, the EDS collects x-ray signals and provide elemental analysis. Mechanical characterization of materials can be done in-situ the Supra 55 using the Kleindiek nano manipulation and force measurement system.

Characteristics & Accessories

  1. Accelerating voltage: 0.1 to 30 kV
  2. High resolution imaging: 1 nm resolution at 15 kV
  3. High efficiency in-lens SE detector
  4. AsB – angle selective backscattered detector
  5. CL – cathodoluminescence detector
  6. EDS Bruker XFlash/60mm 
  7. Variable pressure operation till 1 torr
  8. Nano manipulation system for a nm precision movement (Kelindiek)
  9. Force measurement system for measurements at the nano Newton to micro Newton scale (Kelindiek)

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Elena Kartvelishvily

Sigma 500 SEM (Zeiss)

The Zeiss Sigma 500 is a high resolution SEM. It is equipped with several detectors; the new generation E-T detector can filter out SE3 electrons, thus it collects mainly SE2 electrons and provide topographical information, the in-lens Duo detector collects SE1 and BS electrons and provide high resolution surface information together with material information, the HD-AsB provides material and orientational information.

Characteristics & Accessories

  1. Accelerating voltage: 0.3 to 30 kV
  2. In-Lens Duo detector with filtering grid for the detection of energy selective backscattered electrons
  3. HD-AsB detector

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Eyal Shimoni

XL30 ESEM-FEG (FEI)

Wet, oily, dirty, outgassing and non-conductive samples can be examined in their natural state without significant sample modification or preparation. A series of pressure-limiting apertures integrated in the pole piece creates different levels of vacuum in the specimen chamber and in the column. High pressure, thus created in the chamber, combined with gaseous secondary electron detectors, permits the observation of non-conductive and wet specimens. The microscope also works in the conventional high vacuum mode, providing high resolution images of conductive specimens (2 nm at 5mm working distance).

Characteristics & Accessories

  1. Accelerating voltage: 2 to 30 kV
  2. Environmental modes for pressures as high as 10 torr (H2O or N2)
  3. E-T detector for high vacuum mode
  4. Autrata BS detector (for high vacuum and low vacuum modes)
  5. Gaseous Secondary Electrons detectors (GSED) for different pressure scales
  6. EDS X-ray detector (EDAX)
  7. Heating stage - up to 800°C (Kammrath and Weiss)
  8. Nano manipulation system for a nm precision movement (Kelindiek)
  9. Force measurement system for nano Newton to micro Newton scale (Kelindiek)

 

Contact: Dr. Ifat Kaplan-Ashiri and Dr. Elena Kartvelishvily

Helios 600 FIB/SEM Dual Beam Microscope (FEI)

Dual beam FIB-SEM is a multifunctional analytical instrument integrating both a focused ion beam (FIB) and a scanning electron microscope (SEM) in a single system. This tool offers a number of key techniques and applications: FIB site specific cross sectioning and SEM inspection on a wide variety of samples (electronics, ceramics, metallurgic, biology…), TEM sample preparation, as well as STEM sub-nanoscale imaging, nano-machining and patterning, deposition of Pt, W and C both ion- or electron- assisted and 3D visualization of volumes. Actually, due to its high performance and accessories many other applications arise continuously, so do not hesitate to contact for your specific needs or application.

Characteristics & Accessories

  1. E-beam Schottky FEG, I-beam Ga LMIS
  2. Accelerating Voltage: E-beam 0.35 to 30 kV, I-beam 0.5-30 kV
  3. High resolution imaging: 1 nm resolution at 15 kV, 2.5 nm at 1 kV, WD 4 mm
  4. High resolution ion beam: 5 nm at 30 kV
  5. Probe current: E-beam <22 nA, I-beam 1.5 pA-21 nA
  6. High efficiency in-lens SE/BSE detector
  7. E-T SE/BSE chamber detector
  8. CDEM for SI and SE detection
  9. STEM detector
  10. Beam-assisted material deposition of Pt, W, C
  11. Omniprobe and Kleindiek micromanipulators
  12. Four point probe microscopic measurements
  13. Cryo-stage (BAl-Tec AG, Liechtenstein)
  14. EDS elemental analysis

 

Contact: Katya Rechav

Tecnai Spirit (Bio-Twin) TEM (FEI)

The FEI Spirit TEM microscope is ideal for imaging biological cells and tissues that have been fixed, embedded and stained. The “Bio-Twin” lens configuration provides extremely high contrast, and the ability to observe at extremely low magnifications with the objective aperture inserted. Two digital cameras provide easy recording of images.

Characteristics & Accessories

  1. Accelerating voltage: 60-120 kV
  2. E-beam source, tungsten thermal emission
  3. Bottom-mount CCD camera: FEI Eagle 2k X 2k
  4. Side-mounted high-speed lens-coupled camera: Olympus MegaView III
  5. Multiple Image-stitching for wide field-of-view with high detail

 

Contact: Dr. Nadav Elad,  Dr. Smadar Levin-Zaidman and Dr. Eyal Shimoni

Tecnai T12 (Twin) TEM (FEI)

The FEI Tecnai T12 TEM microscope is used for imaging biological cells and tissues as well as for cryoTEM of biological macromolecules and soft materials. Cryo-blades provide contamination-free environment for observing cryo-preserved specimens. A high-sensitivity,  high-speed, low-noise bottom-mount CMOS camera provides superb quality for all applications, and especially for  low-dose imaging.

Characteristics & Accessories

  1. Accelerating voltage: 60-120 kV
  2. E-beam source, LaB6 thermal emission
  3. Bottom-mount CMOS camera: Gatan OneView
  4. Side-mounted high-speed lens-coupled camera: Gatan Erlangshen ES500W
  5. Cryo-blades and a variety of Gatan cryo-holders (Gatan 626-60, 626-70, 914)
  6. Low-dose software
  7. Tomography-grade compustage

 

Contact: Dr. Nadav Elad, Dr. Eyal Shimoni and Dr. Sharon Wolf

Tecnai G2 F20 (Twin) TEM/STEM -Energy Filtered Direct Electron Detection

The FEI Tecnai G2 F20 S/TEM microscope is used for advanced biological EM imaging, chemical analysis, and 3D structural elucidation by TEM  and STEM tomography, including of cryo-preserved specimens. It features advanced energy filtering and direct electron detection

Characteristics & Accessories

  1. Accelerating voltage: 120-200 kV.
  2. E-beam source, Schottky field emission source.
  3. Gatan TAC100 cryo-blades and a variety of Gatan cryo-holders (Gatan 626-60, 626-70, 914).
  4. Point resolution 0.27 nm. STEM line resolution ~0.34 nm.
  5. FEI Low-Dose software.
  6. Tomography-grade compustage.
  7. CryoTEM imaging using low-dose methods of soft materials, macromolecules and cryo-preserved tissues and cells.
  8.  Gatan Quantum 967 “special” energy filter, with K2 summit direct electron detector.
  9. Chemical and elemental analysis by electron energy loss spectrometry (EELS) and energy filtered imaging (EFTEM).
  10. Energy dispersive spectrometer (EDAX) with retractable, liquid N2 cooled, Si(Li) detector.
  11. STEM and cryoSTEM tomography using a Fischione HAADF detector at the 35 mm port, and a Gatan BF/DF detector below the fluorescent screen.
  12. Tomography software: SerialEM and FEI Explore3D.
  13. STEM-EDX and STEM-PEELS analysis.

 

Contact: Dr. Nadav Elad and Dr. Sharon Wolf

Tecnai F30 (Ultra-Twin) HRTEM (FEI)

The F30 UT microscope is a high resolution microscope (point resolution 0.16nm) dedicated to structural characterization of crystalline materials by lattice imaging, electron diffraction and chemical and elemental analysis and by electron energy loss spectrometry (EELS) and energy filtered imaging (EFTEM).

Characteristics & Accessories

  1. Accelerating voltage: 300 kV
  2. E-beam source, FEG
  3. Bottom-mount CCD camera: Gatan Ultrascan 2k x 2k
  4. Gatan Imaging Filter (GIF2000 spectrometer), energy resolution 0.9eV

 

Contact: Dr. Ronit Popovitz-Biro and Dr. Lothar Houben

JEM 2100 (HT) TEM (JEOL)

The JEM 2100 is dedicated to characterize various materials specimens both nanomaterials and thin lamellas prepared from bulk materials by FIB sectioning. Characterization involves lattice imaging (point resolution 0.24nm), recording of electron diffraction patterns and elemental analysis by EDS. This microscope has STEM mode that enables STEM-EDS line scans and mapping.

Characteristics & Accessories

  1. Accelerating voltage: 200 kV
  2. E-beam source, LaB6 thermal emission
  3. Bottom-mount CCD camera: Gatan UltrascanXP 2k x 2k
  4. Energy dispersive spectrometer (Thermo Fisher) with retractable, SSD detector

 

Contact: Dr. Ronit Popovitz-Biro and Dr. Lothar Houben

Super Resolution Microscope (STORM/PALM)

Vutara SR-200 super resolution microscope is based on single molecule localization techniques (PALM, STORM, etc.). It enables 3D quantitative imaging at the nanoscale, 10 times or better than that of conventional light microscopes.

It contains three microscopes in one platform:

  • 3D super-resolution imaging (PALM/STORM)
  • Single molecule particle tracking

Characteristics & Accessories

  1. 20 nm (xy) resolution, 50 nm (z) resolution
  2. Biplane technology provides 3D imaging during all aqusitions
  3. Supports 4 excitation colors (405,488,561 and 647 nm high power lasers)
  4. Simultaneous two color acquisition
  5. Images as deep as 30 microns

 

Contact: Dr. Tali Dadosh

Deltavision Deconvolution Microscope

The Deltavision microscope excels with certain types of imaging, especially Z-series, 3D reconstruction, time course series, and multiple-color fluorescence microscopy.

Characteristics & Accessories

  1. Olympus IX71 Microscope with 20x (air) and 40x, 60x and 100x (oil) objectives
  2. Xenon Lamp for illumination
  3. Polychroic filter providing excitation and emission wavelengths for DAPI or Hoechst (blue), FITC or GFP (green), rhodamine or R-phycoerythrin (orange), and Cy-5 (deep red)
  4. Nomarski differential interference contrast (DIC) module
  5. Live cell system with associated temperature controller

 

Contact: Dr. Tali Dadosh

Cryo-Light Fluorescent Microscope for Correlative Microscopy

The cryo-light fluorescent microscope enables imaging at cryogenic temperature conditions for the correlation with cryo electron microscopy. It is equipped with LED light source at several wavelengths and a cryo-stage to hold the sample under cryo conditions. It is designed to provide imaging of fluorescently labelled biological specimen on EM grids and thin substrates.

Characteristics & Accessories

  1. Olympus BX51 Microscope with 20x and 40x (air) objectives
  2. LED illumination
  3. Cryo-holder design for speciments including TEM grids (Linkam)

 

Contact: Dr. Tali Dadosh

Xradia Micro-CT X-ray Tomographic Microscope

The Xradia Micro-CT instrument is designed to provide high resolution X-ray tomographic images at 1 µm resolution. Complete 3D images without missing wedge of samples up to 5 cm in size can be obtained by taking a complete set of projection images while the sample rotates 180 or 360 degrees. The final resolution of the images depends on the exposure time, rotation step and inherent contrast in the sample.

Characteristics

  1. X-ray source (Hamamatsu) 20-90KV and up to 200 µA
  2. Focal spot 5 µm
  3. Double projection design (x-ray and optical projection)
  4. Magnifications 0.5x, 4x, 10x, 20x, 40x
  5. Pixel size 0.3-20 µm
  6. Field of view up to 70 mm

Accessories

  1. Filter set with attenuation between 20-70%
  2. Different sample holders
  3. Homemade holder for high humidit

 

Contact: Dr. Vlad Brumfeld

Contact: Vlad Brumfeld