About the service

The Surface Analysis Unit provides the means for a variety of surface-sensitive measurements. These include but are not limited to the chemical composition of the exposed atomic layers, atomic scale surface topography, electronic and mechanical surface properties, and nanoscale surface manipulations. The various facilities of this group are housed in two laboratories that can be generally described as: (1) Scanning Probe Microscopy (SPM) and (2) Electron Spectroscopy (XPS).

Surface Analysis staff.

Sidney Cohen
Sidney Cohen
Tel. 08-934-2703