About the service

X-Ray Diffractometry (XRD) is a powerful, non-destructive technique capable of providing structural characterization of natural and synthetic solids including powders, thin films, single- and poly-crystals. The X-ray Diffraction Laboratory provides a broad variety of measurement techniques that use a combination of modern XRD software and hardware. Together these permit almost all types of structural characterizations of polycrystalline solids that can be realized under laboratory conditions. They include the following:

  • Qualitative and quantitative phase analysis (including evaluation of the degree of crystallinity);
  • Lattice parameter evaluation;
  • Determination of microstrain and evaluation of crystallite size;
  • Crystal structure refinement by the Rietveld method;
  • Texture determination using pole figure mapping;
  • Residual stress measurement;
  • Thin film reflectivity;
  • High-resolution measurements using a Ge (220) channel-cut monochromator;
  • Capillary sample holders for use with materials that require a controlled environment and/or materials with severe preferential orientation on flat plate sample holders;
  • Measurements in the low and medium temperature range (from -180° to 300°C);
  • Measurements under vacuum (10-3mbar) or in a specified gas atmosphere monitored by a residual gas analyzer (RGA 100, Stanford Research Systems, Inc.)
Yishay (Isai) Feldman
Yishay (Isai) Feldman
Head
Tel. 08-934-6041, 052-337-1476