Room:16
Telephone: 4904

Room: 18
Telephone:4904

Single tilt, Gatan cryo holder

Gatan 927 Dual Orientation Room Temperature Holder

Low dose unit

Gatan UltraScan 4000 4k X 4k 4-port CCD camera

GIF/EELS

Gatan Tridiem post-column energy filter

Gatan UltraScan 1000 2k X 2k 4-port GIF CCD camera

STEM

Fischione ultra-high resolution STEM HAADF detector

Gatan BF/DF STEM Detector

EDS

Oxford instruments EDS detector

TEM Tecnai F-30
Room: Annex 14
Telephone: 08-934-4944

This microscope offers high resolution secondary electron imaging at pressures as high as 10 torr and sample temperatures as high as 1,000 °C. This means that wet, oily, dirty, outgassing and non-conductive samples can be examined in their natural state without significant sample modification or preparation.

A series of pressure-limiting apertures integrated in the pole piece creates different levels of vacuum in the specimen chamber and in the column. High pressure, thus created in the chamber, combined with gaseous secondary electron detectors, permits the observation of non-conductive and wet specimens, with resolution of 2 nm.

The microscope also works in the conventional high vacuum mode, providing high resolution images of conductive specimens (2 nm at 5mm working distance).

The instrument has been provided also with an
Accelerating voltage: 0.2 to 30kV
Electron gun: Schottky field emission source.

• EDAX X-ray detector, to perform elemental analysis.
• Wet Mode: Gaseous Secondary Electrons detector (GSED).
• High Vacuum Mode: Everhart-Thornley Secondary Electrons detector and Solid state backscattered electrons detector.

High efficiency in-lens SE and BSE detectors. E-T SE/BSE chamber detector.
CDEM for SI and SE detection. STEM detector.

Beam-assisted material deposition of Pt, W, C, SiO2, Au.
Omniprobe and Kleindiek micromanipulators.
Four point probe microscopic measurements
Cryo-stage (BAl-Tec AG, Liechtenstein)
EDS elemental analysis.