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2011 |
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Inelastic scattering effects and electronic shot noise
M. Kumar, R.H.M. Smit, J.M. van Ruitenbeek, O. Tal
10.1109/ICNF.2011.5994347
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Surprising lack of magnetism in the conductance channels of Pt atomic chains
M. Kumar, R.H.M. Smit, J.M. van Ruitenbeek, O. Tal,
arXiv:1101.3939v1
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2009 |
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Molecular signature of highly conductive metal-molecule-metal junctions
O. Tal, M. Kiguchi, W.H.A. Thijssen, D. Djukic, C. Untiedt, R.H.M. Smit, J.M. van Ruitenbeek
Phys. Rev. B 80, 085427 (2009)
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2008 |
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Electron-vibration interaction in single-molecule junctions: from contact to tunneling regime
O. Tal, M. Krieger, B. Leerink, J.M. van Ruitenbeek
Phys. Rev. Lett. 100, 196804 (2008)
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Highly conductive molecular junctions based on direct binding of benzene to platinum electrodes
M. Kiguchi, O. Tal, S. Wohlthat, F. Pauli, M. Krieger, D. Djukic, J.C. Cuevas, J.M. van Ruitenbeek
Phys. Rev. Lett.101, 046801 (2008)
Editor's Selection. See also: Viewpoint in Physics
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Measurements of the Einstein relation in doped and undoped molecular thin films
O. Tal, I. Epstein, O. Snir, Y. Roichman, Y. Ganot, C. K. Chan, A. Khan, N. Tessler, Y. Rosenwaks
Phys. Rev. B77, 201201 (2008)
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2006 |
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Electronic properties of doped molecular thin films measured by Kelvin probe force microscopy
O. Tal, Y. Rosenwaks
J. Phys. Chem. B 110, 25521 (2006)
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Threshold voltage as a measure of molecular level shift in organic thin film transistors
O. Tal, Y. Preesant, C. K. Chan, Y. Roichman, A. Kahn, N. Tessler, Y. Rosenwaks
Appl. Phys. Lett. 88 43509-11 (2006)
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2005 |
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Direct determination of the hole density of States in undoped and doped amorphous organic
films with high lateral resolution
O. Tal, Y. Rosenwaks, Y. Roichman, N. Tessler, C. K. Chan, A. Kahn
Phys. Rev. Lett. 95 256495-8 (2005)
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Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
O. Tal, Y. Rosenwaks, Y. Preezant, N. Tessler, C. K. Chan, A. Kahn
MRS Proceedings, Organic Thin-Film Electronics, I4.5, 871E, (2005)
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2004 |
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Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy
O. Tal, W. Gao, C. K. Chan, A. Kahn, Y. Rosenwaks
Appl. Phys. Lett. 85, 4148 (2004)
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2001 |
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The effect of substrate topography on the local electronic structure of WS2 nanotubes
O. Tal, M. Remskar, R. Tenne, G. Haase
Chem. Phys. Lett. 344, 434-440 (2001)
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2008 |
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Probe Force Microscopy: Recent Advances and Applications in: Applied Scanning Probe Methods VIII
Y. Rosenwaks, O. Tal, S. Saraf, A.
Schwarzman, E. Lepkifker, and A. Boag, Edited by B. Bhushan, H. Fuchs,
M. Tomitori
Springer Verlag (2008)
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2006 |
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Kelvin Probe Force Microscopy of Semiconductors in:
Scanning Probe Microscopy: Electrical and
Electromechanical Phenomena at the Nanoscale
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, T. Glatzel
Vol. 2, Springer Verlag (2006)
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