Tal Group
ATOMIC SCALE CONDUCTORS
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2014  

Fully spin-polarized conductance in atomic-scale junctions
R. Vardimon, M. Klionsky and O. Tal

Submitted (2014)
 

Electron-vibration interaction in the presence of a switchable Kondo resonance realized in a molecular junction
D. Rakhmilevitch, R.Korytar, A.Bagrets, F.Evers and O. Tal
Physical Review Letters, Accepted (2014)
 

Probing the orbital origin of conductance oscillations in atomic chains
R. Vardimon, T.Yelin, M. Klionsky, S.Sarkar, A.Biller, L.Kronik and O. Tal
Nano Letters 14, 2988 (2014)
 


 

 

 

 


 

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2013  


Electron vibration interaction in multichannel single-molecule junctions
R. Ben-Zvi, R.Vardimon, T.Yelin and O.Tal
ACS Nano 7, 11147 (2013)
 

Experimental determination of conduction channels in atomic scale conductors based on shot noise measurements
R. Vardimon, M. Klionsky and O. Tal

Phys. Rev. B 88, 161404 (2013)
 

Atomically Wired Molecular Junctions: Connecting a Single Organic Molecule by Chains of Metal Atoms
T. Yelin*, R. Vardimon*, N. Kuritz, R. Korytar, A. Bagrets, F. Evers, L. Kronik and O. Tal
Nano Letters 13, 1956 (2013)

* equal contributors

 


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2011  

 
Inelastic scattering effects and electronic shot noise
M. Kumar, R.H.M. Smit, J.M. van Ruitenbeek and O. Tal
10.1109/ICNF.2011.5994347

 

Surprising lack of magnetism in the conductance channels of Pt atomic chains
M. Kumar, O. Tal, R.H.M. Smit and J.M. van Ruitenbeek
arXiv:1101.3939v1

 


 
2009  


Molecular signature of highly conductive metal-molecule-metal junctions
O. Tal, M. Kiguchi, W.H.A. Thijssen, D. Djukic, C. Untiedt, R.H.M. Smit and J.M. van Ruitenbeek
Phys. Rev. B 80, 085427 (2009)

 

2008  


Electron-vibration interaction in single-molecule junctions: from contact to tunneling regime
O. Tal, M. Krieger, B. Leerink and J.M. van Ruitenbeek
Phys. Rev. Lett. 100, 196804 (2008)

 

Highly conductive molecular junctions based on direct binding of benzene to platinum electrodes
M. Kiguchi, O. Tal, S. Wohlthat, F. Pauli, M. Krieger, D. Djukic, J.C. Cuevas and J.M. van Ruitenbeek
Phys. Rev. Lett.101, 046801 (2008)
Editor's Selection. See also: Viewpoint in
Physics
 

Measurements of the Einstein relation in doped and undoped molecular thin films
O. Tal, I. Epstein, O. Snir, Y. Roichman, Y. Ganot, C. K. Chan, A. Khan, N. Tessler and Y. Rosenwaks
Phys. Rev. B77, 201201 (2008)


 

 
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2006  


Electronic properties of doped molecular thin films measured by Kelvin probe force microscopy
O. Tal and Y. Rosenwaks
J. Phys. Chem. B 110, 25521 (2006)

 

Threshold voltage as a measure of molecular level shift in organic thin film transistors
O. Tal, Y. Preesant, C. K. Chan, Y. Roichman, A. Kahn, N. Tessler and Y. Rosenwaks
Appl. Phys. Lett. 88 43509-11 (2006)

 

 
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2005  


Direct determination of the hole density of States in undoped and doped amorphous organic films with high lateral resolution
O. Tal, Y. Rosenwaks, Y. Roichman, N. Tessler, C. K. Chan and A. Kahn
Phys. Rev. Lett. 95 256495-8 (2005)

 

Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
O. Tal, Y. Rosenwaks, Y. Preezant, N. Tessler, C. K. Chan and A. Kahn
MRS Proceedings, Organic Thin-Film Electronics, I4.5, 871E, (2005)

 

 
 
 
 
 
2004  


Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy
O. Tal, W. Gao, C. K. Chan, A. Kahn and Y. Rosenwaks
Appl. Phys. Lett. 85, 4148 (2004)

 

2001  


The effect of substrate topography on the local electronic structure of WS2 nanotubes
O. Tal, M. Remskar, R. Tenne and G. Haase
Chem. Phys. Lett. 344, 434-440 (2001)

 

 

  Books

2008

 

 

   
Probe Force Microscopy: Recent Advances and Applications in: Applied Scanning Probe Methods VIII
Y. Rosenwaks, O. Tal, S. Saraf, A. Schwarzman, E. Lepkifker, and A. Boag, Edited by B. Bhushan, H. Fuchs,
M. Tomitori
Springer Verlag (2008)

2006

 

   
Kelvin Probe Force Microscopy of Semiconductors in: Scanning Probe Microscopy: Electrical and
Electromechanical Phenomena at the Nanoscale

Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, T. Glatzel
Vol. 2, Springer Verlag (2006)