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Vibration-mediated Kondo transport in molecular junctions: conductance evolution during mechanical stretching
D.Rakhmilevitch and O.Tal

Submitted (2015)

High and tunable anisotropic magnetoresistance in single-molecule junctions
D.Rakhmilevitch, S.Sarkar, O.Bitton, L.Kronik and O.Tal
Submitted (2015)

Conductance saturation in highly conductive molecular junctions
T.Yelin, R.Korytar, N.Sukenik, R.Vardimon, B.Kumar, C.Nuckolls, F.Evers and O.Tal
Submitted (2015)

Indication of Complete Spin Filtering in Atomic-Scale Nickel Oxide
R. Vardimon, M. Klionsky and O. Tal

Nano Letters 15, 3894 (2015)











Electron-vibration interaction in the presence of a switchable Kondo resonance realized in a molecular junction
D. Rakhmilevitch, R.Korytar, A.Bagrets, F.Evers and O.Tal
Phys. Rev. Lett. 113, 236603 (2014)

Probing the orbital origin of conductance oscillations in atomic chains
R. Vardimon, T.Yelin, M.Klionsky, S.Sarkar, A.Biller, L.Kronik and O. Tal
Nano Letters 14, 2988 (2014)






Electron vibration interaction in multichannel single-molecule junctions
R. Ben-Zvi, R.Vardimon, T.Yelin and O.Tal
ACS Nano 7, 11147 (2013)

Experimental determination of conduction channels in atomic scale conductors based on shot noise measurements
R. Vardimon, M. Klionsky and O. Tal

Phys. Rev. B 88, 161404 (2013)

Atomically Wired Molecular Junctions: Connecting a Single Organic Molecule by Chains of Metal Atoms
T. Yelin*, R. Vardimon*, N. Kuritz, R. Korytar, A. Bagrets, F. Evers, L. Kronik and O. Tal
Nano Letters 13, 1956 (2013)

* equal contributors

Shot noise and magnetism of Pt atomic chains: Accumulation of points at the boundary
M. Kumar, O. Tal, R. H. M. Smit, A. Smogunov, E. Tosatti, and J. M. van Ruitenbeek
Phys. Rev. B 88, 245431 (2013)











Inelastic scattering effects and electronic shot noise
M. Kumar, R.H.M. Smit, J.M. van Ruitenbeek and O. Tal
Noise and Fluctuations (ICNF) IEEE, 376, (2011)



Molecular signature of highly conductive metal-molecule-metal junctions
O. Tal, M. Kiguchi, W.H.A. Thijssen, D. Djukic, C. Untiedt, R.H.M. Smit and J.M. van Ruitenbeek
Phys. Rev. B 80, 085427 (2009)



Electron-vibration interaction in single-molecule junctions: from contact to tunneling regime
O. Tal, M. Krieger, B. Leerink and J.M. van Ruitenbeek
Phys. Rev. Lett. 100, 196804 (2008)


Highly conductive molecular junctions based on direct binding of benzene to platinum electrodes
M. Kiguchi, O. Tal, S. Wohlthat, F. Pauli, M. Krieger, D. Djukic, J.C. Cuevas and J.M. van Ruitenbeek
Phys. Rev. Lett.101, 046801 (2008)
Editor's Selection. See also: Viewpoint in

Measurements of the Einstein relation in doped and undoped molecular thin films
O. Tal, I. Epstein, O. Snir, Y. Roichman, Y. Ganot, C. K. Chan, A. Khan, N. Tessler and Y. Rosenwaks
Phys. Rev. B77, 201201 (2008)









Electronic properties of doped molecular thin films measured by Kelvin probe force microscopy
O. Tal and Y. Rosenwaks
J. Phys. Chem. B 110, 25521 (2006)


Threshold voltage as a measure of molecular level shift in organic thin film transistors
O. Tal, Y. Preesant, C. K. Chan, Y. Roichman, A. Kahn, N. Tessler and Y. Rosenwaks
Appl. Phys. Lett. 88 43509-11 (2006)






Direct determination of the hole density of States in undoped and doped amorphous organic films with high lateral resolution
O. Tal, Y. Rosenwaks, Y. Roichman, N. Tessler, C. K. Chan and A. Kahn
Phys. Rev. Lett. 95 256495-8 (2005)


Nanoscale Measurements of Electronic Properties in Organic Thin Film Transistors
O. Tal, Y. Rosenwaks, Y. Preezant, N. Tessler, C. K. Chan and A. Kahn
MRS Proceedings, Organic Thin-Film Electronics, I4.5, 871E, (2005)



Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy
O. Tal, W. Gao, C. K. Chan, A. Kahn and Y. Rosenwaks
Appl. Phys. Lett. 85, 4148 (2004)



The effect of substrate topography on the local electronic structure of WS2 nanotubes
O. Tal, M. Remskar, R. Tenne and G. Haase
Chem. Phys. Lett. 344, 434-440 (2001)







Probe Force Microscopy: Recent Advances and Applications in: Applied Scanning Probe Methods VIII
Y. Rosenwaks, O. Tal, S. Saraf, A. Schwarzman, E. Lepkifker, and A. Boag, Edited by B. Bhushan, H. Fuchs,
M. Tomitori
Springer Verlag (2008)



Kelvin Probe Force Microscopy of Semiconductors in: Scanning Probe Microscopy: Electrical and
Electromechanical Phenomena at the Nanoscale

Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, T. Glatzel
Vol. 2, Springer Verlag (2006)