The single electron counting approach provides a "zoom-in" view of the ionization process induced by radiation in the detector medium - a process which is stochastic in its nature. By counting individual ionization charges rather than integrating and multiplying them, we get a better insight to the primary ionization process, un-obscured by additional statistical fluctuations or by integration.
The single electron counting detector (SEC). Radiation induced electrons are deposited in a low pressure gas. They are separated in a weak electric field and subsequently each electron is individually detected, obtaining a pulse train, as seen below:

The method was studied in our group for relativistic particle identification (Publications), used for the measurements of Fano factors and Mean Ionization Energy for x-rays in various gases (Publications), it has been adopted for soft-x-ray (100-700 eV) spectroscopy (Publications)
A 2D spectrum measured with the single electron counter, showing spectral lines of different elements in the soft x-ray energy range.

and to nanodosimetry. It is currently applied for:
The SEC detector.
The SEC mounted on a Scanning Electron Microscope for surface analysis applications.
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