INSTRUMENTATION
Multimode AFM (Bruker AXS)

Capabilities
- Contact, tapping mode, and peak-force scanning of surfaces
- 13 x 13 x 3 micron scanner; 190 x 190 x 6 micron scanner; 100 x 100 x 5 micron scanner with heating/cooling capabilities (-30 - + 100 oC)
- Scanning Capacitance Microscopy
- Scanning Kelvin and Scanning Electrostatic Microscopy
- Magnetic Force Microscopy
- Liquid Cell
- Peak-Force TUNA for current measurement with sub-picoamp sensitivity
- PF-QNM TM mode for quantitative mechanical mapping
- Environmental shield
- Electrochemical STM
- Pico-STM
- Maximum sample size approx. 1 x 1 cm, 5 mm height
NTEGRA (NT-MDT)

Capabilities
- Closed Loop on all available scanners
- Smena AFM head for working in air or liquid work in scanning tip mode with a 100 x 100 x 15 micron scanner.
- SF005 head for working under ambient conditions with 10 x 10 x 9 micron and 90 x 90 x 15 micron scanners.
- Possibility to operate the bottom 100 micron scanner with the Smena head to achieve a combined scan range of the two scanners.
- Contact mode, semicontact mode, SKPM, and EFM are offered on all the above set-ups except that there are no electric modes in liquids.
- Possibility to work with samples up to 10 cm diameter (possibly larger –contact us)
- Works in contact and semicontact modes, as well as SKPM, EFM, and MFM.
Nanowizard 3 (JPK)

Capabilities
- Integrated with a Zeiss Axiozoom microscope with top (ringlight) and bottom LED illumination with maximum magnification 53x NA , and a standard filter set.
- Closed-loop 100 micron scanner (15 microns in z) and automated stage integrated with optics through software for correlative optical and AFM imaging, as well as acquiring a grid of images to build a larger mosaic.
- Liquid cells for working in small cells (60 microliters), inside a meniscus drop or in a petri dish, the latter with heater room temp. at 60 oC.
- Quantitative imaging (QITM) mode for quantitative mechanical mapping.
- Hyperdrive for high-resolution imaging in liquid.
- Contact, AC, QI modes.
Smart SPM/Combiscope (AIST-NT)

Capabilities
- The AFM is placed inside of a glovebox allowing environmental control and equipped with humidity sensor with option for oxygen sensor.
- Built-in optics allowing external laser illumination at the tip-surface junction between approx 300-700 nm.
- Variable temperature between -500 C to + 1000 C.
- 100 x 100 x 15 micron closed-loop scanner
- Sample size up to 3 x 10 cm approx.
- C-AFM with selectable amplifers allowing sensitivity of <1 pA at lowest range up to +/- 10 microAmp with correspondingly reduced sensitivity.
- Contact, semicontact, EFM, MFM and KPFM “top” mode and “top-I” mode capabilities.
XP Nanoindenter (Agilent)

Capabilities
- XP head for a load range up to 500 mN
- DCM head for a load range up to 15 mN
- Continuous stiffness (CSM) for continuous measurement of modulus and hardness with depth.
- NanovisionTM for nanoscale imaging of surfaces with the indenter tip before and after indenting
- Variety of diamond indenter tips: Berkovich, Vickers, flat punch, spherical, Knoop
Big G 12000 SPM (RHK)

Capabilities
a. This microscope is placed inside an electromagnet which can reach field of 1 Tesla.
b. Scanning range 5 microns xy, 700 nm z
c. Current-AFM with separate low and high amplifier ranges
d. Two-pass techniques including EFM and SKPM