About the service

The Scanning Probe Microscope (SPM) provides high-resolution imaging of surfaces by means of a fine probe that allows not only physical images, but also surface manipulations, and measurement of mechanical, electrical, and various force-related characteristics of the surface.

SPM is a family of techniques that have in common a fine probe that physically scans across a surface while measuring not only topography, but also electrical, mechanical, magnetic, optical, and other properties at resolutions that can reach the atomic level. The SPM can be operated in any environment – ambient, vacuum, or liquid. In addition to SPM instrumentation, the lab also houses a nanoindenter for precise nanomechanical testing on a wide range of samples.

Please note the use of acronyms on these pages: 

  • STM: scanning tunneling microscopy
  • AFM: atomic force microscopy
  • EFM: electric force microscopy
  • MFM: magnetic force microscopy
  • SKPM: Scanning Kelvin Probe Microscopy
Sidney Cohen
Sidney Cohen
Tel. +972-8-934-2703 , 054-459-0250