About the service

X-ray diffractometry (XRD) is a powerful, non-destructive technique capable of providing structural characterization of natural and synthetic solids including powders, thin films, single- and poly-crystals. The X-ray diffraction laboratory provides a broad variety of measurement techniques that use a combination of modern XRD instruments (manufactured by Rigaku Corporation, Japan) and the most powerful commercial software, Jade Pro (MDI, USA). Together, these permit almost all types of structural characterization of materials that can be realized under laboratory conditions. The methods include:

  • Qualitative phase analysis, including automatic search/match using PDF-4+ database (ICDD);
  • Quantitative phase analysis, including evaluation of the degree of crystallinity;
  • Lattice parameter evaluation (precise positioning of the sample is required);
  • Determination of microstrain and evaluation of crystallite size (coherent scattering length < 300 nm);
  • Crystal structure refinement by the Pawley method;
  • Texture determination using pole figure mapping;
  • Residual stress measurement;
  • Reciprocal space mapping;
  • Thin film reflectivity for thickness, density and estimation of surface roughness;
  • High-resolution measurements using a Ge (220) 2-bounce monochromator and analyzer;
  • Ge (220) 4-bounce monochromator providing single wavelength (Ka1 ) X-rays;
  • Capillary sample holders for materials that require a controlled environment and/or materials with severe preferential orientation on flat plate sample holders;
  • Diffraction measurements on materials maintained in the temperature range: -180° to 300°C;
  • Diffraction measurements on materials maintained in the temperature range: ambient to  1000°C;
  • Measurements under vacuum (10-2 mbar) or in a specified gas atmosphere (e.g. N2, He)
  • Wide angle and small angle X-ray scattering – (WAXS / SAXS)- in transmission, using a high- resolution 2-dimensional  solid state detector;
  • In-plane measurements for textured thin films;
  • Surface mapping to determine structure heterogeneity;
  • Powdered samples can be measured in reflection on zero-background Si or quartz plates.