INSTRUMENTATION

Rigaku TTRAX III – the most powerful diffractometer for all types of solids

With a high-intensity, rotating Cu anode (line source = 0.1×10 mm), the  TTRAX III (18kW) theta-theta vertical diffractometer is equipped with Cross Beam Optics (CBO) which enables simple configurational change from Bragg-Brentano (parafocusing) to parallel beam optics. A bent/flat graphite monochromator and a scintillation detector are aligned in the diffracted beam. There is also a video camera for positioning the sample. The basic sample holder is an Euler cradle, which, in addition to providing precise sample alignment, ensuring exact peak position in powder diffraction patterns, allows the analysis of texture and residual stress, as well as thin film reflectivity. When required, a capillary mount can be installed; or a variable temperature (-180°C to 300° C) sample holder, operating under vacuum (10-2 mbar) or in a specified gas atmosphere.

In addition, there is an option for “snapshot” mode, using  a high speed, high sensitivity, high-resolution 1D solid state  X-ray detector, the  Mythen 1K (Dectris Ltd., Switzerland). The Mythen contains 1280, 50 μm × 8 mm strips, each of which can collect up to 2×105 photons per second. It can provide simultaneous counting of X-rays within a 2-theta range of 12.5° with angular resolution of 0.01°. In combination with a high intensity X-ray source, this detector is particulary suitable for small amounts of sample, as well as when it is necessary to avoid lengthy data collection time, for example, if the sample is under any external influence: temperature change, electric field, etc.

The TTRAX III is the only diffractometer of its kind in Israel and Europe; there are a few in the United States.

Rigaku Ultima III – the workhorse powder diffractometer

The Ultima III theta-theta vertical diffractometer has a sealed tube providing 2kW of power and Cu X-radiation (line source = 0.1×10 mm). Equipped with a CBO, configurational change from parafocusing conditions (Bragg-Brentano) to parallel beam optics is easily accomplished. A bent/flat graphite monochromator and a scintillation detector are aligned in the diffracted beam. The standard attachment is a 6-sample changer, which is very practical and convenient for routine phase analysis. A capillary mount can be installed when necessary.

This diffractometer is simple to use, requires no sample alignment, and is the ultimate training tool for novice users.

 

Rigaku SmartLab - state-of-the-art, high resolution, multipurpose diffractometer equipped with a 2-dimensional detector

SmartLab (Rigaku Corporation, Japan) is an advanced, high-resolution X-ray diffractometer equipped with a high flux 9 kW (PhotonMax) rotating anode, X-ray line source (0.04×8 mm). The Cross Beam Optics (CBO) system enables simple configurational change from parafocussing (Bragg-Brentano) to parallel beam optics. The high-resolution, two-dimensional (2D) solid state detector (HyPix-3000) presents a large active area (~ 3000 mm²) with pixel size of 100 μm that can collect up to 2×106 photons per second per pixel. The detector supports 0D (point), 1D (line) and 2D measurement modes, permitting all applications to be handled with a single detector.

The HyPix-3000 can be used to obtain 2D powder patterns, which can then be processed to deliver superior quality analysis using all the 2D imaging information. The system incorporates a high-resolution θ / θ closed loop goniometer drive system with, in addition, an in-plane diffraction arm. This versatile machine enables powder diffraction, thin film analysis, SAXS with evacuated beam path, WAXS, in-plane scattering and other methods listed on the service page. Powders, thin films, fibers, fabrics, nanoparticles, both dry and in liquid dispersion, etc. can be investigated in a variety of environments and temperatures from ambient to 1000° C. All measurements are performed with the new Rigaku SmartLab Studio II software suite, which is an integrated software platform incorporating all functions from measurement to analysis.

All methods listed in the service description, with the exception of low temperature measurements, can be implemented using the SmartLab diffractometer.