Fields of interest

Quantitative XPS

  • Variability in the photoelectron attenuation parameters;
  • Coating evaluations for various particle geometries;
  • Beam induced effects: damage, intentionally induced conformations, chemical reactions, etc.
  • Developing novel methods for improved XPS analyses

Surface Science

  • Self-assembly characteristics of molecular layers
  • Interfaces: structural characteristics, band-offsets, diffusion across.
  • Charge transport efficiencies at various length-scales, from atomic to the sub-mm scale.
  • Developing the CREM technique: electrical measurements in and by the XPS


  • Distance dependent loss efficiencies in the non-touching beam (aloof) configuration of scanning transmission electron microscopy.
  • Nano-plasmonics