Complementary Techniques

In addition to the Surface force balance and Nuclear reaction analysis approaches, we make extensive use of several more-or-less standard methods. These include ellipsometry to measure thickness and refractive index of ultra-thin films, X-ray Photoemission Spectroscopy (XPS) to probe chemical composition in the first few �ngstroms of a surface, Atomic Force Microscopy for imaging of nanometric surface structures, and Optical Phase Interference Microscopy, OPIM (with the group of Dr. Rachel Yerushalmi-Rozen at Ben Gurion University) to image surface topography with angstrom depth resolution in a non-destructive manner. We also use computerised video-microscopy to follow changing properties in time (mainly in the wetting and dewetting experiments). These different approaches yield a multidimensional picture of the surface and interfacial behaviour.

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