Atomic Force Microscopy

All AFM services fall under the guidance and expertise of the surface analysis unit led by Sidney Cohen of the Chemical Research Support services.

We work with a number of instruments for imaging topography as well as other electrical parameters using tapping mode, contact mode and torsional resonance mode (TR mode). Current maps are obtained using special cantilever holders and conducting tips (usually SiN coated with Au, Pt, Pt-Ir, TiN, and more). Other cantilever holders allow us to image surfaces held in liquid solutions or under Nitrogen or air flow. Below features some of our more regularly used instruments:


AIST-NT - temperature and humidity control, with optical and conducting probe capability (with lock in amplifier)


Bruker - imaging and conducting probe