With the advent of super-resolution microscopy, the last ~25 years have seen a revolution in optical microscopy, pushing the spatial resolution capabilities of optical microscopy towards length scales that were typically accessible only by electron microscopy. In my presentation, I will give a short overview of the different principal approaches to super-resolution microscopy. I will briefly discuss the concepts of Structured Illumination Microscopy (SIM), Stimulated Emission Depletion (STED) microscopy, and Single Molecule Localization Microscopy (SMLM). Then, I will focus on two specific techniques where our group has contributed most. The first is Image Scanning Microscopy or ISM [1-3]. This technique uses a simple combination of confocal microscopy with wide-field image detection for doubling the resolution of conventional microscopy. I will explain the physical principals behind ISM, and the various kinds of its implementation. Meanwhile, ISM has found broad and wide applications and lies behind state-of-the-art commercial systems such as the extremely successful AiryScan microscope from Carl Zeiss Jena. The second method is Super-resolution Optical Fluctuation Imaging (SOFI), which uses the stochastic blinking of emitters for overcoming the classical diffraction limit of resolution, similar to single-molecule localization microscopy, but with much relaxed demands on blinking behavior and label density . The third method is Metal-Induced Energy Transfer imaging or MIET imaging [5-6]. It addresses the axial resolution in microscopy, which is particularly important for resolving three-dimensional structures. MIET is based on the intricate electrodynamic interaction of fluorescent emitters with metallic nanostructures. I will present the basic principles and several applications of this technique.