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SEM

Manipulation, mechanical properties measurements

SEM

Manipulation, mechanical properties measurements

Nano-mechanics is a field devoted to the characterization of nanomaterials or bulk material mechanical properties and behavior at the nanoscale. Measurements of the mechanical properties and the assessment of materials’ deformation mechanisms at the nanoscale have presented new…

STEM

SEM

STEM

Scanning transmission electron microscopy (STEM) is an imaging method that can be used both in TEM and SEM. In SEM extremely low accelerating voltages (2-30kV) can be used to image very thin sections. The technique requires a special detector (diode) that is mounted under the…

Large area imaging

SEM

Large area imaging

High throughput SEM and large samples (millimeters and more) imaging are quite limited and usually are not applicable for high resolution imaging. Software solutions for automated acquisition can be used to overcome the challenge. The Quattro S ESEM (Thermo Fisher Scientific) is…

Wet mode SEM

SEM

Wet mode SEM

An environmental scanning electron microscope can work at a higher chamber pressure compared to regular SEM being operated at low pressures (10^-5-10^-7 mbar). Wet mode SEM is a special case where water vapor is introduced into the microscope chamber at a pressure as high as 2000…

CPD drying

SEM

CPD drying

Characterization and imaging of hydrated samples, and specifically biological samples, under electron microscopes is challenging as these operate under dry high vacuum conditions. Unless an environmental SEM is available, any moist or gas vapor found in the chamber causes severe…

Cryo SEM - life science

SEM

Cryo SEM - life science

With the exception of the environmental SEM, liquid water cannot be observed in the SEM due to the high vacuum in the microscope’s column. Due to this limitation, most aqueous samples, biological or synthetic, are observed in the SEM only after the application of chemical…

Manipulation, mechanical properties measurements

SEM

Manipulation, mechanical properties measurements

STEM

SEM

STEM

Cathodoluminescence - (CL)

SEM

Cathodoluminescence - (CL)

Cathodoluminescence (CL) - is the emission of light as a result of the interaction of a material with the electron beam. CL spectrometer and detector in SEM can be used to characterize the composition, optical and electronic properties of materials. A CL spectrometer and detector…

EDS

SEM

EDS

Energy dispersive x-ray spectroscopy (EDS) is widely used as a chemical analysis technique in scanning electron microscopy (SEM). It enables the detection of elements both qualitatively and quantitatively simultaneously with any imaging mode of the SEM. In the last decade the…